Standard Test Method for
Trace Metallic Impurities in Electronic Grade AluminumCopper,
Aluminum-Silicon, and Aluminum-Copper-Silicon
Alloys by High-Mass-Resolution Glow Discharge Mass
This standard is issued under the fixed designation F 1845; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (e) indicates an editorial change since the last revision or reapproval.
click below Astm F 1845 – 97 (Reapproved 2002) pdf free download